Abstract
Present work is dedicated to investigation of radiation optical properties of SiO2:Ge glass fibers produced by Fujikura and Corning Glass. Distribution of Ge dopant characteristics in core and cladding of quartz fibers have been determined. Ge dopant rings shaped luminescence in optical fibers has been observed. New method of determination the Ge dopant distribution in core and cladding cross sectional profile of silica glass fibers is presented. The thermoluminescence and light storage processes in fibers affected by x-ray radiation have been investigated. The photoluminescence investigations shows that there are two bands of luminescence with 400 nm and 550 nm maxima, which appear in different temperature stimulation conditions. Obtained results are discussed.
Highlights
For over than 40 years doped quartz optical fibers were used in optical communication systems and different optical fiber devices
Slight impurity content of chlorine ions has been detected in Fujikura LWP fiber sample which might have occurred as the remainder of the batch used in the preparation process
The parameters of cathodo, photo-and thermoluminescence of samples of Fujikura LWP and Corning SMF-28e+ germanium doped silicate glass fibers are described taking into account the profile of germanium dopant distribution in the core and cladding of glass fiber
Summary
For over than 40 years doped quartz optical fibers were used in optical communication systems and different optical fiber devices. This paper is focused on photo-, radio-, cathodo- and thermoluminescence properties of germanium doped Fujikura and Corning silicate glass fibers. Our studies have been performed by taking into account the distribution of germanium dopant profile in the core center and cladding in glass fibers basing on the original method [16]. 2. Samples and research methodology Germanium dopant distribution profile of the core center and cladding of quartz fiber s research was carried out for a number of samples of germanium glass fibers Fujikura LWP and Corning SMF-28e+. Profile measurements and map of the dopant ion distribution in the glass fibers were acquired using an electron microscope Zeiss Sigma VP equipped with energy dispersive analysis attachment INCA Oxford Instruments. The sample temperature was varied for 4 K during the measurement of one spectrum
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