Radiation Hardness of Ovonic Devices

Abstract

Ovonic threshold switches have been exposed to pulses of flash X-rays to levels of 1.8×1011 rads/sec and to fast neutron fluences of as high as nvt = 1.2×1017 n/cm2. The switching devices have continued to function during the transient of the X-ray flash and experienced no permanent damage or change of their electrical parameters in excess of the resolution of the experimental testing procedure which was about ±100% in the case of the neutron exposure.