Radiation hardness characterization of LKH-5 scintillating glass

Abstract

Radiation hardness is an important property to examine in scintillators to help determine their expected lifetime in application cases where significant radiation dose is expected. Industrial imaging systems using 9 MV linear accelerators for x-ray radiography are one such application where significant radiation doses are expected to the scintillators used. Cadmium tungstate scintillators (CWO) and Thallium doped Cesium Iodide scintillators (CsI(Tl)) are used in some high energy cargo x-ray radiography systems. However, CWO has a high manufacturing cost for adequately uniform crystals and CsI(Tl) does not have sufficient radiation hardness. LKH-5 glass is being investigated as a potential low cost replacement for CWO and CsI(Tl). In this experiment 36 samples of a terbium doped silicate glass called LKH-5 were irradiated at doses up to 5 MRad using a 9 MV linear accelerator, and the change in their transmission properties was observed. The glass was discovered to be a radiation hard glass due to the relatively small change in the transmission of the glass: less than 3% per cm at its emission peak of 550 nm and 5 MRad. This is similar to CWO which has a reported reduction in transmitted light of 2% per cm at 5 MRad and the emission peak of 475 nm and better than CsI(Tl) which is reported to have a reduction in transmitted light of 5% per cm at the emission peak of 550 nm and 4.2 MRad dose. Furthermore, an annealing procedure is described that returned the transmission of the glass to pre-irradiation values.