Abstract
The surface Na concentration of glass is found to increase under X-ray flux. The experimental data are well fitted by a first-order rate equation and are interpreted on the basis of radiation-enhanced diffusion mechanism of the Na with a coupling between material and defect fluxes. The Na concentration-versus-depth profiles show that the phenomenon also takes place at depth greater than the XPS sampling depth. Moreover, there is some evidence that in addition to diffusion from the bulk, surface segragation also occurs.
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