Radiation Defects in Silicon due to Hadrons and Leptons, their Annealing and Influence on Detector Performance

Abstract

A phenomenological model was developed to explain quantitatively, without free parameters, the production of primary defects in silicon after particle irradiation, the kinetics of their evolution toward equilibrium and their influence on detector parameters. The type of the projectile particle and its energy is considered in the evaluation of the concentration of primary defects. Vacancy-interstitial annihilation, interstitial migration to sinks, vacancy-impurity complexes (VP, VO, V2O), and divacancy (V2) formation are taken into account in different irradiation conditions, for different concentrations of impurities in the semiconductor material, for 20 and 0°C. The model can be extended to include other vacancy and interstitial complexes. The density of the reverse current in the detector after irradiation is estimated. Comparison with experimental measurements is performed. A special application considered in the paper is the modelled case of the behaviour of silicon detectors operating in the pion field estimated for the LHC accelerator, under continuum generation and annealing.