Abstract
In the proliferation of papers dealing with charging effects of insulators submitted to an electron bombardment, the macroscopic consequences of charging are quite always considered without any consideration on the microscopic causes. The electric field built up and potential are only the electrostatic consequence of the trapped charge distribution, ρ(r,t), and, consequently of the trapping mechanisms of charged particles. On the other hand, the radiation damage effects are often explained by microscopic mechanisms (such as the Knotek-Feibelmann model) despite the fact that most of these radiation damages occur in insulators where a very large electric field may be established : If all the particles penetrating into the insulators where trapped for a long time the calculated electric field will reach 107 V/cm in less than one second (for a beam density of 1 μA/mm2). The above remark suggests that the (positive or negative) charged particles are not all trapped or, if they are, it is with a very short trapping time τr.)
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
