Abstract
Abstract We propose the use of X-ray diffraction associated with Rietveld Method (RM-XRD) for soil components quantification aiming at evaluating photon attenuation parameters (total and partial attenuation coefficients (µ), effective atomic number (Zeff), effective electron density (Nel) and cross-sections per atom (σa) and per electron (σe)). The XCOM computer code was utilized to calculate these parameters. The X-ray fluorescence spectroscopy (XRF) technique was used as reference for the quantification of soil components. Good agreement was found between XRF and RM-XRD for photons ranging from medium to high energies. Photons of low energy (
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