Radiation and Fault Injection Testing of a Fine-Grained Error Detection Technique for FPGAs

Abstract

We present the experimental evaluation of a fine-grained hardening approach that exploits underused and abundant resources found in state-of-the-art SRAM-based FPGAs to detect radiation-induced errors on configuration memories. The technique's main goal is to provide the benefits of fine-grained redundancy, namely improved diagnosis and reduced error latency, with a reduced area overhead. Neutron experiments, validated with fault injection campaigns, demonstrate the proposed technique's efficiency when compared to the traditional dual modular redundancy.