Abstract
The author suggests that time and money could be saved and more meaningful electromagnetic interference (EMI) test results could be obtained if existing MIL-STD EMI test procedures were modified to permit cabinet (unit) level testing to be conducted while having the total system electronics interconnected in a system-level environment. He proposes a concept in which electronic systems consisting of more than one cabinet could be EMI tested while configured and operating in a system-level, testbed type of environment. This would require the development of a portable electromagnetically isolated test chamber that has built-in near-field measurement sensors that permit the chamber to be utilized in an oversized system development laboratory which has been peripherally shielded with copper screening. >
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