Radial elemental and phase separation in Ni-Mn-Ga glass-coated microwires

Abstract

In this manuscript, radial elemental and phase separation in Ni-Mn-Ga glass-coated microwires with high excess Ni as a result of high-temperature annealing was observed. Partial manganese evaporation from the outer part of the metallic nucleus and glass melting results in the formation of manganese oxide at the surface. The lack of manganese due to its evaporation induces Ni3Ga formation in the intermediate part, while in the middle part of the metallic nucleus, the residual L21 phase with an average chemical composition of Ni60Mn9Ga31 remains. The layered structure exhibits soft ferromagnetic behavior below 270 K. The results were discussed taking into account the chemical composition, arising internal stresses, recrystallization, and atomic ordering.