Abstract

Galerkin's method in the Hankel transform domain (HTD) is applied to the determination of the radar cross section (RCS) of stacked circular microstrip patches fabricated on a two-layered substrate which may be made of a uniaxial anisotropic dielectric, a magnetized ferrite or a chiral material. Concerning the case of stacked patches printed on magnetized ferrites, the results show that substantial RCS reduction can be achieved inside the tunable frequency band where magnetostatic mode propagation is allowed. It is also shown that both the frequency and the level of the RCS peaks obtained for circular patches fabricated on anisotropic dielectrics or chiral materials may be substantially different from those obtained when substrate anisotropy or substrate chirality are ignored.

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