Abstract

In monolithic perovskite silicon dual‐junction solar cells, it is crucial that the subcells are current‐matched to maximize performance. The most precise method to determine the current (mis)match of a monolithic dual‐junction solar cell is a spectrometric measurement with, e.g., a light‐emitting diode (LED)‐based solar simulator. However, recoding multiple current voltage curves (IV curves) under different red‐ and blueshifted spectra relative to the AM1.5g reference spectrum is time‐consuming. Herein, a new method is suggested to quickly test solar cells for current mismatch. A solar simulator with two lasers instead of multiple LEDs is used, so that two monitor diodes can track intensity changes of each light source during the measurement. Postmeasurement corrections can be applied using this data, circumventing long stabilization times of the solar simulator. To minimize the scan time, it is focused only on determining the correct short‐circuit current and not the full IV curve. The measurement method is validated comparing it to conventional spectrometric measurements using a stable III–V monolithic dual‐junction solar cell. The measurement on the proof‐of‐concept setup shows a deviation of only 2.3% in the current at the current matching point compared to the reference measurement.

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