Abstract
There exist many photovoltaic (PV) power plants which are based on thin-film technology. Unlike PV power plant with crystalline silicon technology, the diagnostic possibilities of thin-film PV modules are limited due to seasonal effects and problematic utilization of thermography. The main problem of degradation of these PV plants is the area degradation which affects even PV power plants with transformer inverters. Although there exist measurement methods based on <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">I–V</i> curve measurement, these methods require specific climatic conditions (clear sky, sufficient irradiance) and time. Here, we present the novel approach to diagnose thin-film modules affected with degradation which provides quick results with low-cost equipment.
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