Abstract
In order to improve the machinability of Titanium alloys a better understanding of the chip formation process is needed. Microstructural analysis of chips produced at high cutting speeds could lead to a first estimation of temperature and the degree of deformation, if structural changes can be observed. Such analysis can be performed by means of TEM only, but microstructural observations on the cross-section of the chip is essential for this. Therefore a method for preparation of cross-sectional TEM specimen from Ti6Al4V chips has been developed. The preparation steps are presented in detail and some micrographs from these specimen are given in this work.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
