Abstract
We study the microstructure of a recently developed composite film [A. Wakabayashi et al.: Langmuir 22 (2006) 9260] by field emission scanning electron microscopy and by applying the box-counting method to the obtained microscope images. The fractal analysis of the images revealed that a fractal network structure consisting of antimony-doped tin oxide (ATO) nanoparticles was formed on the film surface. The identified microstructure is consistent with the resistivity behavior of a film with a low critical concentration for percolation.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
