Abstract

Direct interface circuits are a simple, inexpensive alternative for the digital conversion of a sensor reading, and in some of these circuits only passive calibration elements are required in order to carry out this conversion. In the case of resistive sensors, the most accurate methods of calibration, namely two-point calibration method (TPCM) and fast calibration methods I and II (FCMs I and II), require two calibration resistors to estimate the value of a sensor. However, although FCMs I and II considerably reduce the time necessary to estimate the value of the sensor, this may still be excessive in certain applications, such as when making repetitive readings of a sensor or readings of a large series of sensors. For these situations, this paper proposes a series of calibration methods that decrease the mean estimation time. Some of the proposed methods (quasi single-point calibration methods) are based on the TPCM, while others (fast quasi single-point calibration methods) make the most of the advantages of FCM. In general, the proposed methods significantly reduce estimation times in exchange for a small increase in errors. To validate the proposal, a circuit with a Xilinx XC3S50AN-4TQG144C FPGA has been designed and resistors in the range (267.56 Ω, 7464.5 Ω) have been measured. For 20 repetitive measurements, the proposed methods achieve time reductions of up to 61% with a relative error increase of only 0.1%.

Highlights

  • Sensors interfacing with digital devices may be one of the most popular topics in electronics today

  • The performances obtained with the quasi single-point calibration methods (QSPCMs), single-point calibration method (SPCM), and two-point calibration method (TPCM) have been compared using an FPGA (Xilinx XC3S50AN-4TQG144C, Xilinx Inc., San Jose, CA, USA) [34] as a programmable digital device (PDD) mounted on a FR-4 fiberglass substrate with four layers

  • The TPCM is a calibration method commonly used in Direct interface circuits (DICs) for measuring resistive sensors, since it presents fewer errors in estimations than the SPCM

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Summary

Introduction

Sensors interfacing with digital devices may be one of the most popular topics in electronics today. The additional components may be a transistor or even a logic gate Another important difference between the various types of DICs is the use of analogue elements that may be included in the PDDs. For example, we currently find microprocessors that can include analogue-to-digital converters (ADCs) or analogue comparators. DICs that do not require additional active components or analogue elements within the PDDs will obviously be preferred. This type of DICs usually performs a time-to-digital conversion in the PDD in order to obtain the value of the physical magnitude to be measured and will be used in this paper for the specific case of resistive sensors. Using a DIC can result in a reduction in costs, complexity, and power consumption in the measurement chain compared to the use of a traditional scheme with ADCs and signal conditioning circuits

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