Abstract
We are presently investigating the feasibility of developing a technique that will allow direct traceable microwave electric field (E-field) measurements. The new approach is based on atomic rf-resonance spectroscopy, where an applied electrical field causes a transition between high-lying Rydberg states of an atom. The new technique will allow direct E-field measurements traceable to fundamental physical constants and SI units. If successful, this self calibrating probe will provide more accurate field measurements along with better sensitivity than do present techniques. Direct traceable E-field measurements with sensitivities below 0.1 V/m could be possible.
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