Abstract
Magnetoresistance measurements are presented for accumulation layers at anodic oxide films on n-type Cd0.2Hg0.8Te in both perpendicular and tilted magnetic fields. Five electric sub-bands are occupied in zero magnetic field and the magnetic depopulation of the four highest sub-bands is observed in a parallel orientation. The relative occupations of each sub-band are deduced and their shifts with respect to E0 in magnetic field are estimated.
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