Abstract
Conductivity of quantized multilayer metal films is analyzed with an emphasis on scattering by rough interlayer interfaces. Three different types of quantum size effect (QSE) in conductivity are predicted. Two of these QSE's are similar to those in films with scattering by rough walls. The third type of QSE is unique and is observed only for certain positions of the interface. The corresponding peaks in conductivity are very narrow and high with a finite cutoff which is due only to some other scattering mechanism or the smearing of the interface. There are two classes of these geometric resonances. Some of the resonance positions of the interface are universal and do not depend on the strength of the interface potential while the others are sensitive to this potential. This geometric QSE gradually disappears with an increase in the width of the interlayer potential barrier.
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