Abstract

The anomalous low-temperature properties of glasses arise from intrinsic excitable entities, so-called tunneling Two-Level-Systems (TLS), whose microscopic nature has been baffling solid-state physicists for decades. TLS have become particularly important for micro-fabricated quantum devices such as superconducting qubits, where they are a major source of decoherence. Here, we present a method to characterize individual TLS in virtually arbitrary materials deposited as thin films. The material is used as the dielectric in a capacitor that shunts the Josephson junction of a superconducting qubit. In such a hybrid quantum system the qubit serves as an interface to detect and control individual TLS. We demonstrate spectroscopic measurements of TLS resonances, evaluate their coupling to applied strain and DC-electric fields, and find evidence of strong interaction between coherent TLS in the sample material. Our approach opens avenues for quantum material spectroscopy to investigate the structure of tunneling defects and to develop low-loss dielectrics that are urgently required for the advancement of superconducting quantum computers.

Highlights

  • We are still lacking an explanation for the behaviour of amorphous materials at low temperatures

  • To be able to detect a TLS dipole moment p∥ of minimum 0.1 eÅ42, and assuming a rather conservative T1 ≈ 1μs, we arrive at a dielectric layer thickness d ≈ 70 nm

  • For the 1.5–2 nm thin[51,52,53] and 17.17 μm[2] large tunnel barriers of the two stray junctions shown in Fig. 1d, our measurements indicate a TLS volume density of P0,JJ = 360 to 270 ðμm[3] Á GHzÞÀ1, in good agreement to previous work[40]. This is about six times smaller than the TLS density found in the thicker layer of deposited AlOx in the sample capacitor

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Summary

Introduction

We are still lacking an explanation for the behaviour of amorphous materials at low temperatures

Methods
Results
Conclusion
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