Abstract
We report ellipsometric measurements made on semiconductor samples using photon-correlated beams produced by the process of spontaneous parametric down-conversion. Such a source yields higher accuracy than its quantum-limited conventional counterpart. We also show that our approach has the added advantage of not requiring an external reference sample for calibration.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
