Abstract

Pixels in both hybridized and monolithic complementary metal-oxide semiconductor CMOS detector arrays may couple capaci- tively to their neighboring pixels. This interpixel capacitance can signifi- cantly distort the characterization of conversion efficiency and modula- tion transfer function MTF in CMOS devices. These effects have been largely unaccounted for in measurements to date. In this work, the ef- fects of this coupling are investigated. Compensation methods for these errors are described and applied to silicon P-I-N array measurements. The measurement of Poisson noise, traditionally done by finding the mean square difference in a pair of images, needs to be modified to include the mean square correlation of differences with neighboring pixels. © 2006 Society of Photo-Optical Instrumentation Engineers.

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