Abstract
An automatic measurement system has been used to determine the values of quantized Hall resistances R <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">H</inf> in terms of the National Measurement Laboratory (NML) realization of the International System (SI) ohm. The quantized Hall resistances of two GaAs-AlGaAs heterostructures were measured. The n = 2 step of one heterostructure and the n = 4 step of the other were measured over a seven-month period. A weighted mean of these determinations gave a value for the quantity R <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">H</inf> (n = 1) of 0.383 ppm (0.078 ppm one-standard-deviation (1σ) uncertainty) above the nominal 25 812.80 Ω in SI units.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IEEE Transactions on Instrumentation and Measurement
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
