Abstract
Abstract We have compared the results of quantitative topography measurements on typical industrial, rolled or etched aluminium surfaces, using three different methods that can measure surface features in the 10-μm to sub-micrometre range. The methods used, atomic force microscopy (AFM), white-light interferometry, and confocal laser scanning microscopy (LSM), utilize very different mechanisms of image formation. We find good agreement between data measured by AFM and by white-light interferometry. The two techniques complement each other. AFM is not limited to reflecting samples, it has a better resolution than interferometry, and it can measure steeper slopes. White-light interferometry is faster and allows larger areas to be analysed, and data from neighbouring areas can be spliced more easily. When used on strongly reflecting, rolled or etched aluminium surfaces, LSM yields results that deviate strongly from those of the other two methods and from the true sample surface topography.
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