Quantitative single-shot phase imaging with a dielectric metasurface

Abstract

Dielectric metasurfaces have recently attracted much attention due to their ability to efficiently control light propagation, that is, its amplitude, phase and polarization, on micro- and macro- levels. Such metasurfaces also naturally allow for integration in compact optical setups due to their small sizes. An important issue of energy losses is also addressed by employing all-dielectric platform. Advancements in nanofabrication have enabled realization of metasurface-based high-resolution wavefront engineering devices, which have been employed in different imaging applications, for example, as metalenses, polarization filters, metaholograms, etc. Quantitative phase imaging is a powerful tool for the optical inspection of transparent samples in connection with biological and technical applications. By measuring thickness and/or refractive index profiles, phase imaging facilitates, for example, the observation of dynamic events in unstained cells. As such, it has become indispensable in biological imaging, wavefront correction and metrology. However, conventional cameras and photodetectors are inherently not sensitive to the phase of an incident lightwave. As a consequence, direct phase detection is challenging. Only by multiple intensity measurements or application of specialized interferometric schemes, the phase profile of an object can be in principle reconstructed. In this paper, we report on the ability of metasurfaces to contribute to quantitative phase imaging by independent control of the phase profiles in two orthogonal polarization states of an incident beam.