Abstract
This paper demonstrates that SIMS is a very sensitive method for determining the hydroxyl content of thin oxide films on metals and alloys, provided standards are used to calibrate the technique. Detection limits of ±0.1% hydroxyl have been achieved. Within this limit, no hydroxyl is present within passive films on iron and nickel, while passive films on Fe−25Cr contain only within the inner chromium‐rich part of the film and within the outer iron‐rich part of the film. Nonpassive films, such as the electropolish film on nickel and Fe−25Cr, and the film formed on nickel in F− containing solution, contain significant amounts of hydroxyl ions.
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