Abstract
Quantitative measurement of domain wall widths in a magnetic thin foil of Nd2Fe14B and a patterned Ni88Fe12 Permalloy element is obtained by the analysis of coherent shadow deformation of an electrostatic biprism in an electron microscope. Information related to the phase gradient in the direction perpendicular to the biprism is extracted by comparing the recorded shadow images with simulations computed according to the experimental electron optical configuration and by varying a single free parameter: the domain wall width. We demonstrate the feasibility of such experiments and the usefulness of the technique for characterization of magnetic features at different length scales.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
