Abstract
Preferred orientation is immediately visible on synchrotron diffraction images as intensity variations along Debye rings. In this report, the Rietveld method is applied to obtain quantitative information about the orientation distribution from the analysis of a single synchrotron diffraction image. The method is illustrated for hexagonal cold-rolled zirconium, investigatedin situin a vacuum furnace with high-energy X-rays, both before and after the onset of recrystallization.
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