Abstract
At Fudan University, the work of quantitative analysis of thick samples had already begun in 1977 (Ref. [1], J. Fudan Univ. (Nat. Sci.) 1 (1977) 73), mainly for the analysis of the sword of Yue Prince Gou Jian. The software TSPIXE for quantitative analysis of thick samples was completed in 1992 (Ref. [2], Chin. J. Nucl. Phys. 15 (1993) 133). In this paper the theory and database of the software are described. The software has been applied to calculate the trace elemental concentrations of biological, geological and archaeological samples. Some results concerning these samples are presented. Compared to the old version, TSPIXE II has incorporated secondary fluorescence. Representative results of the metal analysis considering the secondary fluorescence effect are presented. The new version of the software TSPIXE now under programming deals with multilayer samples. A preliminary result is also presented.
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