Abstract
Dual-wavelength digital holography has recently become a promising tool for achieving higher axial measurement ranges in microscopy. However, digital filtering, such as Fourier transform, or a separate hologram acquisition process is essential for retrieving the quantitative phase information of each respective wavelength. In this paper, a quantitative phase reconstruction method based on an infrared-like single wave conversion in dual-wavelength phase-shift digital holography, which does not require any of the processes mentioned above, has been proposed. Based on the proposed method, the quantitative phase information on the axial measurement specimen was simply obtained by only a phase-shift of a quarter of an infrared-like single wave which has the same magnitude of the synthetic wavelength. This approach simplifies not only the hologram acquisition process but also the numerical reconstruction process. The newly proposed theory is verified and evaluated using simulations and experimental validation.
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