Abstract

The Rietveld method using X-ray powder diffraction data was applied to selected skarn samples for quantitative determination of the present minerals. The specimens include garnet, clinopyroxene–garnet, plagioclase–clinopyroxene–wollastonite–garnet, plagioclase–clinopyroxene–wollastonite, plagioclase–clinopyroxene–wollastonite–epidote, and plagioclase–clinopyroxene skarns. The rocks are coarse- to fine-grained and characterized by an uneven distribution of the constituent minerals. The traditional methods for quantitative analysis (point-counting and norm calculations) are not applicable for such inhomogeneous samples containing minerals with highly variable chemical compositions. Up to eight individual mineral phases have been measured in each sample. To obtain the mineral quantities in the skarn rocks preliminary optical microscopy and chemical investigation by electron probe microanalysis (EPMA) were performed for the identification of some starting components for the Rietveld analysis and to make comparison with the Rietveld X-ray powder diffraction results. All of the refinements are acceptable, as can be judged by the standard indices of agreement and by the visual fits of the observed and calculated diffraction profiles. A good correlation between the refined mineral compositions and the data of the EPMA measurements was achieved.

Highlights

  • The estimation of relative quantities of the constituent minerals in rocks is essential for their classification and determination of paragenesis as well as for studies of their genesis, sequence of different mineralogical stages and geological events

  • The Rietveld method is one of the most appropriate techniques for modal analysis of rocks and synthetic polycrystalline materials based on X-ray powder diffraction (XRPD)

  • Subsequently was successfully applied to crystal-structure refinements of minerals and synthetic equivalents investigated with X-ray powder diffraction and synchrotron radiation [3,4,5,6]

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Summary

Introduction

The estimation of relative quantities of the constituent minerals in rocks is essential for their classification and determination of paragenesis as well as for studies of their genesis, sequence of different mineralogical stages and geological events. The Rietveld method is one of the most appropriate techniques for modal analysis of rocks and synthetic polycrystalline materials based on X-ray powder diffraction (XRPD) This method was originally developed for the refinement of structures studied with neutron-diffraction [1,2]. Subsequently was successfully applied to crystal-structure refinements of minerals and synthetic equivalents investigated with X-ray powder diffraction and synchrotron radiation [3,4,5,6] This methodology and the possibilities for quantitative analysis were developed in detail in the works of: Albinati and Willis [7], Hill [8], Hill and Madsen [9], Hill and Howard [10], Bish and Howard [11], Post and Bish [12], Snyder and Bish [13], Hill [14], Young [15].

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