Quantitative Magnetic Force Microscopy: Transfer-Function Method Revisited

Abstract

Magnetic force microscopy (MFM) is a characterization method used to obtain images of the stray field emanating from the surface of magnetic samples with high spatial resolution. The MFM signal arises from a convolution of the magnetic moment distribution of the MFM tip with the stray field of the sample. Therefore, deconvolution of the stray field of a magnetic sample requires a well-defined micromagnetic structure of a tip. While the magnetic moment distribution of the tip remains challenging to assess, it is convenient to calibrate the tip-equivalent magnetic charge in a plane parallel to the sample surface running through the tip apex using a suitable tip-calibration method. Once the tip-equivalent magnetic charge is calibrated, MFM data can be deconvolved to obtain the stray field of the sample or the equivalent magnetic surface charge, for example, at the sample surface. Here we use low-noise MFM data obtained with high-quality-factor cantilevers and a modified L-curve method for the optimization of a Tikhonov deconvolution procedure used for the calibration of the MFM tip, and---once the tip is calibrated---for obtaining the stray field or magnetic surface charge of the sample.