Abstract
Coherent diffractive imaging (CDI) has become a standard method on a variety of synchrotron beam lines. The high brilliance short wavelength radiation from these sources can be used to reconstruct attenuation and relative phase of a sample with nanometre resolution via CDI methods. However, the interaction between the sample and high energy ionising radiation can cause degradation to sample structure. We demonstrate, using a laboratory based high harmonic generation (HHG) based extreme ultraviolet (EUV) source, imaging a sample of hippocampal neurons using the ptychography method. The significant increase in contrast of the sample in the EUV light allows identification of damage induced from exposure to 7.3 keV photons, without causing any damage to the sample itself.
Highlights
The study of hippocampal neurons is of great interest to the scientific community to understand mechanisms that can lead to neuro-degenerative disease
For the case of the diffraction patterns collected using the high harmonic generation (HHG) source, where both pointing stability and intensity stability are significantly poorer than the synchrotron source, the orthogonal probe relaxation ptychography (OPRP) method [7] was used for the reconstruction
It was assumed that because the inelastic interaction of the hard X-ray photons with the sample is very weak, the dose deposited in the sample would be below the radiation damage threshold
Summary
The study of hippocampal neurons is of great interest to the scientific community to understand mechanisms that can lead to neuro-degenerative disease. Ptychography records scatter patterns at multiple partially overlapping regions of the sample illuminated by spatially confined structured illumination [1]. IR to hard X-rays, the laboratory EUV sources are readily available, inexpensive, and in the case of HHG sources the coherent photon flux is approaching / comparable to synchrotron sources as shown in [4] where the flux was 1 × 1012 photons/sec .
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