Abstract
Results are presented for the trace analysis of Pd and Rh by time-of-flight-resonance ionization mass spectrometry (TOF-RIMS). The spectrometer, developed at the Advanced Mineral Technology Laboratory (Ontario, Canada), is based on a commercial laser-induced mass analyzer with upgrades that include independent laser ablation and ionization sources and pulsed ion optics to minimize noise caused by primary ion formation. The schemes presented for Rh and particularly for Pd detection are simpler than others reported in the literature. The experimental laser fluences were found to be in reasonable agreement with theoretical estimates. The TOF-RIMS measurements were quantified on the basis of calibration curves derived using reference samples covering 3 orders of magnitude in concentration. Minimum detection limits of ~15 parts per billion were found for both metals, with a precision of ~ +/-15%. Samples from sulfide, iron oxide, and silicate minerals were also examined. The results are in excellent agreement with those obtained using dynamics secondary ion mass spectrometry.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
