Abstract
The z-component of both the magnetization and the stray field of a nanometer sized single domain magnetic Co/Pt multilayer dot with perpendicular magnetic anisotropy is determined quantitatively within the point probe approximation by magnetic force microscopy (MFM). The MFM tip used is calibrated by probing omega-shaped nanosized current rings fabricated by electron-beam lithography. Since the stray field geometry of the dot and the current rings are similar, the calibrated tip can be used to determine quantitatively the magnetization and the stray field of the dot with perpendicular magnetic anisotropy.
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