Abstract
Abstract Experiments and theoretical work on spinodal decomposition of thin films of binary polymer blends indicate large changes in phase behavior and dynamics relative to the bulk behavior due to the complex interactions of the polymer-polymer, polymer-air, and polymer-substrate interfaces. Currently used techniques are able to sense growing domain sizes but are not always able to sense local two and three dimensional variations within domains. We are using a new characterization approach to these thin films utilizing the Scanning Transmission X-ray Microscope (STXM) at beamline XIA at the National Synchrotron Light Source (NSLS)2. We extract component thickness maps of each polymer in a sample region. This allows for quantitative investigation of the dynamics of polymer phase separation and should allow the determination of important parameters affecting the domain formation in these thin films.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
