Abstract
Amplified Spontaneous Emission (ASE) properties and ASE threshold are usually investigated for the characterization of a candidate active material for laser applications. However, the comparison among different materials is often hampered by the use in literature of several different methods to estimate the ASE threshold. In this work we quantitatively compare the ASE threshold values obtained by using the most employed methods in dye-doped polymer and lead halide perovskite thin films, highlighting the dependence of the value obtained on the applied method.
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