Quantitative analysis of X-ray photoelectron spectroscopy intensities for dealuminated zeolites and supported catalysts where the promoter-forming elements also occur in the support

Abstract

The model developed by Kerkhof and Moulijn for the interpretation of X-ray photoelectron spectroscopy (XPS) intensity ratios of uniformly dispersed catalysts was extended because the promoter consists only of chemical elements which also occur in the support. The model is made to investigate photoemission data of different species of the same chemical element which are indiscriminate with respect to their chemical shifts. The model is applied to a series of dealuminated Y zeolites. Thus, the respective Al:Si XPS intensity ratios of high dealuminated Y zeolites are explained by dispersion of the non-framework aluminium on the mesopores surface.