Abstract
We present a technique for the quantitative analysis of magnetic force microscope (MFM) images of individual Cartesian components of stray field obtained using the AC detection method in the absence of an applied field. We term this xMFM, yMFM and zMFM. Images have been obtained of a 10 kfci array of all ones bits written onto longitudinal CoCrPtTa media suitable for data densities up to 5 Gbit/in 2. An interpretation is made of the images in the light of previous studies using MFM in the presence of an applied field and scanning tunnelling MFM. We discuss methods for obtaining bit transition widhhs from xMFM and zMFM data and define experimental transition widhhs for the two techniques. Transition widhhs obtained from the quantitative analysis of MFM data are presented and found to be significantly larger than the predictions of the arctangent transition model.
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