Quantitative analysis of trace and major elements in thin sections of soils with the secondary ion microscope (Cameca)

Abstract

A series of experiments have been performed for a number of years to obtain quantitative microchemical analysis by secondary ion microscopy of materials in thin sections of soils. The first successful quantification was obtained from an area with a diameter of 300 μm in bauxite and done with an IMS 300 at Philips Research Laboratories. Such an area, however, is frequently too large for most soil samples which are extremely heterogeneous even on a microscale. A second generation IMS 3F was tested for soils at the Cameca factory in Paris. This instrument allows the quantification of trace and major elements of soil constituents in a spot with 1.5 μm diameter, using a computer program developed by Philips Research Laboratories. Calcite and clay from a Petrocalcic Xerochrept were used for this test. Ion spectra, ion images and linear traverses were made giving information on the nature and distribution of both major and trace elements. The possibility of investigating a larger number of chemical elements simultaneously in linear traverses is of considerable help in the study of thin sections. Various submicroscopic and other techniques are discussed to give some insight into the position of ion microscopy amongst these.