Abstract
Mo–Si–B alloys show great potential as high temperature materials. Due to peak overlapping of B‐Kα and Mo‐Mζ, analyzing these alloys with microanalysis presents a real challenge. This paper describes the analytical methodology used to qualify and quantify the boron content in these alloys without stoichiometric reference samples by the use of a single parallel‐beam wavelength dispersive spectrometer. Characterization of boron is performed by using a coupled energy dispersive X‐ray spectroscopy—wavelength dispersive spectroscopy system in a scanning electron microscope. Self‐made pure element samples are used for calibration and quantification of the boron content.
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