Abstract
A study of domain walls in amorphous TbFeCo alloy and Co/Pt multilayer thin films suitable for magneto-optic recording has been made using magnetic force microscopy. The quantitative analysis of magnetic force microscope (MFM) data in order to obtain domain wall widths is outlined and a methodology for the measurement of the dimensions of features in MFM images independent of imaging conditions introduced. It was found that the size of features corresponding to domain walls are approximately an order of magnitude larger than expected.
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