Abstract
SummaryThe lattice rotations underneath a nanoindentation in GaN are measured from the energy-filtered convergent beam electron diffraction patterns generated by scanning transmission electron microscopy (STEM). These rotations reveal a kink band not visible in STEM high angle annular dark field images. Furthermore, the diffraction data allows the lowest-energy configuration of dislocations associated with the kink band rotations to be estimated.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
