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Abstract
Conventional, derivative mode AES, in combination with Ar + sputtering, was applied to a wide range of commercial Fe-Cr and Fe-Ni-Cr alloys. The roles played by matrix effects, sputtering phenomena, peak interference, peak height variation and poor vacuum backpressure in obtaining quantitative analyses were studied. Alloys were analysed in both oxidised and sputter-cleaned states, with several techniques being developed to allow rapid and simple quantitative analysis.
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