Quantification of SOFC anode microstructure based on dual beam FIB-SEM technique

Abstract

The three-dimensional microstructure of an SOFC anode is quantified using a dual beam focused ion beam scanning electron microscopy (FIB-SEM) system equipped with an energy dispersive X-ray spectroscopy (EDX) unit. The microstructure of the Ni–YSZ anode is virtually reconstructed in a computational field using a series of acquired two-dimensional SEM images. The three-phase boundary (TPB) density and tortuosity factors are carefully evaluated by applying two different evaluation methods to each parameter. The TPB density is estimated by a volume expansion method and a centroid method, while the tortuosity factors are evaluated by a random walk calculation and a lattice Boltzmann method (LBM). Estimates of each parameter obtained by the two methods are in good agreement with each other, thereby validating the reliability of the analysis methods proposed in this study.