Abstract
Journal Article Quantification of Low Voltage Images of 2-dimensional Materials in Aberration Corrected Scanning Transmission Electron Microscopy. Get access Mark P Oxley, Mark P Oxley Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge TN, USA Search for other works by this author on: Oxford Academic Google Scholar Nicholas G Cross, Nicholas G Cross University of Tennessee, Materials Science and Engineering, Knoxville TN, USA Search for other works by this author on: Oxford Academic Google Scholar Gerd Duscher, Gerd Duscher University of Tennessee, Materials Science and Engineering, Knoxville TN, USA Search for other works by this author on: Oxford Academic Google Scholar Leslie J Allen, Leslie J Allen University of Melbourne, School of Physics, Parkville Victoria, Australia Search for other works by this author on: Oxford Academic Google Scholar Matthew F Chisholm Matthew F Chisholm Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge TN, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 464–465, https://doi.org/10.1017/S1431927617003002 Published: 04 August 2017
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