Quantification of Liquid Crystal Concentrations in Periodically Stratified Polymer-Dispersed Liquid Crystal Films by Dynamic Secondary Ion Mass Spectrometry and Multivariate Statistical Analysis

Abstract

Liquid crystal (LC) concentrations in stratified holographic polymer-dispersed liquid crystal (PDLC) films have been quantified from depth profiles obtained by time-of-flight secondary ion mass spectrometry (SIMS). The volatile nature of the LCs was hindered during SIMS analysis by capping the PDLC samples with poly(vinyl alcohol) and cooling to cryogenic temperatures. It remains difficult to gain quantitative results from SIMS analysis due to matrix effects yielding complex SIMS fingerprint spectra. With the multivariate statistical method discriminant function analysis the LC contents in the stratified holographic PDLC films were quantified. The concentration of the LC-rich layers was determined to be 32.9 ± 3.4 wt % LC, and for the polymer-rich layers it was 28.8 ± 2.7 wt % LC. The low concentration difference was supported by imaging analysis and modeling results.