Quantification of H, B and F in Kornerupine: Accuracy of SIMS and SREF (X-Ray Single-Crystal Structure-Refinement) Data

Abstract

We use a multiple-analytical approach based on secondary-ion mass-spectrometry (SIMS), X-ray single-crystal structure refinement (SREF) and electron-probe micro-analysis (EPMA) to derive the complete crystal-chemical formula of a B-rich kornerupine-group mineral, prismatine, from Hrarigahy, Madagascar: (Ca0.01Li0.02Mg0.20Fe2+0.10) (Mg3.57Fe2+0.06 Al5.37) (Si3.84B0.91Al0.26)O21 (OH1.08F0.07). SIMS matrix effects related to crystal structure were investigated by analyzing two grains with a known crystallographic orientation relative to the ion beam.