Quantification of H, B and F in Kornerupine: Accuracy of SIMS and SREF (X-Ray Single-Crystal Structure-Refinement) Data

Luisa Ottolini,Frank C Hawthorne,Fernando Cámara

doi:10.1007/s006040200050

Quantification of H, B and F in Kornerupine: Accuracy of SIMS and SREF (X-Ray Single-Crystal Structure-Refinement) Data

Luisa Ottolini, Frank C Hawthorne + Show 1 more

https://doi.org/10.1007/s006040200050

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Journal: Microchimica Acta	Publication Date: May 1, 2002
Citations: 4

Affiliation: Institute for the Dynamics of Environmental Processes, University of Manitoba

#X-ray Single-crystal Structure Refinement #Single-crystal Structure Refinement + Show 8 more

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Abstract

We use a multiple-analytical approach based on secondary-ion mass-spectrometry (SIMS), X-ray single-crystal structure refinement (SREF) and electron-probe micro-analysis (EPMA) to derive the complete crystal-chemical formula of a B-rich kornerupine-group mineral, prismatine, from Hrarigahy, Madagascar: (Ca0.01Li0.02Mg0.20Fe2+0.10) (Mg3.57Fe2+0.06 Al5.37) (Si3.84B0.91Al0.26)O21 (OH1.08F0.07). SIMS matrix effects related to crystal structure were investigated by analyzing two grains with a known crystallographic orientation relative to the ion beam.

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