Quantification of dark-field effects in single-shot grid-based x-ray imaging

Abstract

Dark-field (DF) x-ray imaging (DFXI) is a technology that can obtain information relating to the small-angle x-ray scattering of a sample. In this paper, we report on the quantification of DF effects by measuring the real space correlation function of scattering samples in a single-shot grid-based x-ray imaging setup that enables a simple approach to DFXI. The experimental measurements of the DF effects in our imaging setup were in good agreement with the theoretical quantification over the entire range of test conditions, thus verifying its effectiveness for single-shot grid-based DFXI. Consequently, we were able to clearly understand the associated particle-scale selectivity, which can help us determine suitable applications for single-shot grid-based x-ray DFXI.